HYPERION II FT-IR and QCL Microscope

HYPERION II

The HYPERION II is our versatile FT-IR microscope for research and development with flexible accessories and the possibility to combine Infrared Laser Imaging (QCL) and FT-IR in one instrument.

Description

HYPERION II features:

Selection of detectors for µ-FT-IR:
Broad-, mid, narrow-band LN₂-MCTs,
thermoelectrically cooled (TE) MCT.
Focal-plane array detector for infrared imaging (64 x 64 or 128 x 128 pixel).
Optional QCL implementation by Laser Infrared Imaging Module (ILIM, laser class 1)
Objective lens selection: 3.5x/15x/36x IR,
20x ATR, 15x GIR, 4x/40x VIS.
Spectral range extension – from Near-Infrared (NIR) to Far-Infrared (FIR)
Selection of apertures: manual knife-edge, automated knife-edge aperture wheel. Metal apertures for NIR
Selection of accessories and sample stages: macro IR imaging accessory, cooling/heating stage, sample compartment, etc.
Selection of visual/optical tools: Darkfield illumination, Fluorescence illumination, VIS polarizers, IR polarizers, etc.

HYPERION II provides:

Perfect match of spectral and visual images. Applies to any measurement mode (including ATR imaging).
Diffraction limited high sensitivity FT-IR microscopy and imaging by using focal plane array (FPA) detector.
First ever combination of FT-IR and QCL technology by (optional) Infrared Laser Imaging Module (ILIM, laser class 1).
Infrared laser imaging in all measurement modes (ATR, Transmission, Reflectance).
Patented coherence reduction for artifact free Laser Imaging measurements without sensitivity or speed loss.
High imaging speeds:
0.1 mm²per second (FPA, full spectrum)
6.4 mm² per second (ILIM, single wavenumber)
Optional TE-MCT detector to perform IR microscopy with high spatial resolution and sensitivity without liquid Nitrogen.
Emission spectroscopy capability and optional spectral range extensions.