Description
The VERTEX FT-IR research spectrometer productline is the culmination of everything Bruker has pioneered and developed in over 40 years.
VERTEX spectrometers share a wide range of features, including an intelligent network for automation, Automatic Component Recognition (ACR), the Plug & Play Ethernet connection and Automatic Accessory Recognition (AAR).
VERTEX 70v – Innovation with Integrity
FTIRThe VERTEX 70v FTIR spectrometer offers unmatched performance and versatility for demanding analytical and research applica-tions.
- Near IR, visible and far IR/THz spectral range extensions
- BRUKER FM far and mid IR technology based on unique optical components
- Wear-free RockSolidTM interferometer
- Software selectable up to 5 exit and 2 input beam ports
- Fully evacuable optics
- Easy beamsplitter change without active interferometer alignment
- Automated internal/external sources and detectors switching option
- Digi TectTM parallel 2-channel 24-bit dynamic range ADC
- Automatic optical components recognition
Unmatched FT-IR Performance
The VERTEX 70v is a fully digital FTIR spectrometer for demanding R&D applications. Its innovative design results in the highest flexibility and high-est performance. The data acquisition is based on two channel delta-sigma ADCs with 24-bit dynamic range, which are integrated into the detector preamplifier electronics. This advanced DigiTectTM technology prevents external signal disturbance and guarantees the highest signal-to-noise ratio.
Vacuum Optics
With the evacuable optics bench of the VERTEX 70v vacuum FTIR spectrometer, PEAK sensitivity in the mid-, near and far IR/THz regions are obtained without the fear of masking very weak spectral features caused by water vapor or CO2 absorptions. Outstanding results, e.g. in the area of nano-science research down to sub-monolayers, can be obtained.
Wide Spectral Range
The VERTEX 70v can optionally be equipped with optical components to cover the spectral range from 10 cm-1 in the far IR/THz, through the mid and near IR up to the VIS/UV spectral range at 28,000 cm-1. With its pre-aligned optical components and permanently aligned RockSolidTM interferometer, range change is easy and maintenance free.
VERTEX 80/80v
The VERTEX 80 and the VERTEX 80v vacuum FT-IR spectrometers are based on the actively aligned UltraScan™ interferometer, which provides PEAK spectral resolution. The precise linear air bearing scanner and PEAK quality optics guarantees the ultimate sensitivity and stability. The VERTEX 80v is an evacuated optics bench that can eliminate atmospheric moisture absorptions for ultimate sensitivity and stability; enabling demanding experiments such as high resolution, ultra fast rapidscan, step-scan, or UV spectral range measurements.
- PMA 50 Polarization Modulation Accessory for VCD and PM-IRRAS
- PL II Photoluminescence module
- RAM II FT-Raman module and the RamanScope III FT-Raman microscope
- TGA-FT-IR coupling
- HYPERION series FT-IR microscope
- HYPERION 3000 FT-IR imaging system
- HTS-XT High Throughput Screening eXTension
- IMAC Focal Plane Array macro imaging accessory
- External sample compartment XSA, evacuable or purgeable
- External vacuum tight UHV chamber adaptation
- Vacuum PL/PT/PR measurement unit
- Low temperature liquid He or cryogenic liquid free cryostats
- Fiber optic coupling unit with MIR or NIR fiber probes for solids and liquids
- Large integrating spheres
- Auto sampler devices
- External FIR Hg source
- Unique wide range MIR-FIR detector
- Solid State far IR / THz beamsplitter
- External emission adapter
- External high performance MIR source
- External high performance VIS source
- External vacuum 4-position detector chamber (for vacuum optics)
- Bolometer adaptation for detection in the FIR range
- Automatic beamsplitter exchange unit (BMS-c) (for vacuum optics)
Optical resolution
The VERTEX 80 and the VERTEX 80v standard configuration provides apodized spectral resolution of better than 0.2 cm-1, which is sufficient for most ambient pressure gas phase studies and room temperature sample measurements. For advanced low temperature work, e. g. on crystalline semiconductor materials or gas phase measurements at lower pressure, a PEAK resolution of better than 0.06 cm-1 is available. This is the highest spectral resolution achieved using a commercial bench top FT-IR spectrometer. High resolution spectra in the visible spectral range demonstrate a resolving power (wavenumber ν divided by spectral resolution ∆ν) of better 300,000:1.
Versatility
The innovative optics design results in the most flexible and expandable R&D vacuum FT-IR spectrometer available. With the evacuated optics bench, PEAK sensitivity in the mid-, near- and far IR regions is obtained without the fear of masking very weak spectral features by air water vapor absorptions. Outstanding results, e.g. in the area of nanoscience research down to less than 10-3 monolayers, can be obtained with the VERTEX 80v vacuum FT-IR spectrometer. There are virtually no limitations with respect to flexibility. Five beam exit ports on the right, front and left side and two beam input ports on the right and rear side of the optics bench are available. This allows simultaneous connection of, for example, a synchrotron light source using the rear side input port, the PMA 50 polarization modulation accessory at the right side exit beam, a fiber optics coupling at the right front side port, a bolometer detector at the left front and the HYPERION series FT-IR microscope at the left side exit beam.
